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Observations of Dislocations in Copper using Borrmann Transmission Topographs

 

作者: F. W. Young,   F. A. Sherrill,   M. C. Wittels,  

 

期刊: Journal of Applied Physics  (AIP Available online 1965)
卷期: Volume 36, issue 7  

页码: 2225-2230

 

ISSN:0021-8979

 

年代: 1965

 

DOI:10.1063/1.1714455

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Using the Borrmann diffracted beams for AgK&agr;radiation, x‐ray topographs have been made of copper crystal plates 1 × 1 ×Zcm,Z≦ 0.1, with (111) faces. Dislocation lines were generally recorded as lines of less intensity on the x‐ray plate. Both annealed and neutron irradiated crystals were investigated. In the latter the dislocations were pinned and were not moved by the small stresses accidently imposed while making the topographs; and dislocation arrangements in the bulk crystal were determined. The Burgers vectors were deduced from {111} topographs, employing the condition that for no contrastg· b= 0. For edge dislocations, the additional conditiong × n= 0 was necessary for no contrast, and it was demonstrated that this type of contrast was more pronounced for dislocations grouped in a slip trace. It was found that dislocations could be seen all the way through crystals forZ= 0.06 cm. A semiquantitative correlation has been established between etch pits formed at dislocation sites on the (111) surfaces and the dislocations revealed by the x‐ray topography. It has been possible to obtain complete sets of topographs on only a few annealed crystals; for these, an analysis of the dislocations produced by accidental microstrains has been possible.

 

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