Measurement of interdiffusion by high angle hollow cone illumination
作者:
J. C. Ewert,
F. Hartung,
G. Schmitz,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 10
页码: 1311-1313
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119881
出版商: AIP
数据来源: AIP
摘要:
High angle hollow cone darkfield orZ-contrast imaging is used to supress dynamical contributions like bend or extinction contours to electron imaging. Using a multiple scattering model it is possible to interpret image intensities quantitatively and to analyze specimen composition on a nanometer scale without specialized detectors like energy-energy-loss spectroscopy or energy dispersive spectroscopy. This method is practically tested on the interdiffusion of Cu-Au couples. Measured thin film interdiffusion coefficents, are comparable to literature data of the bulk diffusion coefficent in this system. ©1997 American Institute of Physics.
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