269 SUBJECT INDEX Subjects are classified according to the section or sub-scction in which they occur. Methods for the determination of individual elements are not included in this Index as they can readily be obtained from the alphabetical listings in tbc Tablcs in Chapter 4. Tables ;ire denoted by use of the prefix T. AAS, spectrometers, T2.5C data processing, 2.3.4 Absolute analysis, 1.4 Accuracy, 3.2; 4.5.1 Acid digestion, 4.4.2 Air, analysis of, T4.5A 4.5.3.2; T4.5A particulate, analysis of, 1.3.3; 4.5.3.1; particulate standards, 3.3.1 non-dispersive, 4.6.4 ICP atomization, 1.2.1.2 Air plasma torch, 1.2.2.4; 4.5.3.3 Alumina, analysis of, 4.3.2 Aluminium alloys, analysis of, 1.1 .I .3; 4.2.2.1 Amino acids, 4.1.2.2 Analyte, loss of, 4.8.1 Analytical curves, shapes of, 1.3.2; 3.2 Antihistamines, determination of, 4.8.3 Applications of, ICP, 1.2.1.6; 4.1.1.1; 4.6.5 AFS, electrothermal atomization, 1.4.4; 4.6.4 MIP, 1.2.2.3 CMP, 12.2.4; 4.8.4 d.c.arc plasma, 1.2.3.2 horizontal, 4.4.2 temperature, 1.1.1.1 Arc, discharge, 1.1.1; 4.2.1.1; 4.3; 4.4.1 Ashing temperature, 4.7.2 Atmosphere, analysis of, 4.5.1; 4.5.3 particulates, analysis of, 1.3.3; 4.5.3.1; Atomic, absorption, dynamic range of, 1.3.1 Atomic, absorption spectrometers, T2.5C Atomic, distribution in flames, 1.3.2 4.5.3.2 line profiles in flames, 1.3.1 line profiles in HCL, 1.1.2 vapour transport in flames, 1.3.1 flame, 1.3 glow discharge, 1.1.2 kinetics of, 1.4.2 laser, 1.4.2 mechanisms, 1.4.2 spark, 1.1.1.1 Atomization, electrothermal, 1.4; I .4.2 Automated sample preparation, 4.5.2.1 Automatic sampling, 4.8.1 for ETA, 2.4.2 for FAAS, 2.4.2 Automation, 1.3.3; 4.5.2.2 Auxiliary plasma, 1.2.2.2 Babington nebulizer, 1.2.1.3 Baby food, analysis of, 4.7.3 Background absorption in ETA, 1.4.3; 3.2.2.2 correction, 1.2.1.5; 1.3.2:2.3.4; 4.8.3 correction by Zeeman effect, 2.2.1 Beenakker cavity, 1.2.2.1; 1.2.2.2 Beverages, analysis of, T4.7 Biological digestion, 4.7.2 Blood, analysis of 1.3.3 Body, fluids, analysis of, T4.8 tissues, analysis of, T4.8 Boiler feed water, analysis of, 4.5.2.1 Boron, analysis of, 1.1.I .3 Branched capillary nebulizer, 1.3.3; 4.7.3 Brine, analysis of, 4.1.2.2 Bronze, analysis of, 4.2.2,l Buffers, in arcs, 1.1.1.2 in flames, 3.2.3.2 in sparks, 1.1.1.2 CMP, 4.8.4 Carbide formation in flames, 1.3.2 Carbon, fibre vaporizer, 1.4.1 filament atomizers, 1.2.1.3; 1.4.1 furnace atomic emission, 1.4.4 Cathodic sputtering, 1.1.2 Cement, analysis of, T4.3 Ceramics, analysis of, T4.3 Certified reference materials, 4.5.1 Chelation, 4.5.3.1 Chemicals, analysis of, T4.1 B Chemiluminescence, 1.3.2; 4.2.1.1 Chlorinated hydrocarbons, determinations Chromium, interferences, 3.2.2.1 Clay, analysis of, 3.1.2 of, 4.5.2.3370 Analytical A tomic Spectroscopy Coal, analysis of, 4.4.2 Cobalt, retention during ashing, 4.6.2 Cold-vapour mercury determination, 1.5.2; Computer, simulation of TCP, 1.2.1.4 Concentration techniques, 4.6.2 Concentric nebulizer, 1.2.1.3 Configuration of d.c.arc plasma, 1.2.3.1 Contamination, 3.1.2 Continuum sources, 1.3.1; 2.1.2 Copper, analysis of, 1.1.4 alloys, analysis of, 1.1.4 Correlation techniques, 1.3.2 Cross-flow nebulizer, 1.2.I .3 Curve-fitting, 1.2.1.5 determination of, 4.8.3 3.1.2; 4.6.3 Data processing, 2.3 D.c. arc, 1.1.1; 4.7.4; 4.8.4 D.c. arc plasma, 1.2.3; 4.5.2.3; 4.6.5 Delves cup, 1.3.3; 4.8.3 Demountable, ICP torch, 1.2.1.4 Depth profile by GDL, 1.1.4 Detection limits, 1.2.1.1; 1.2.3.2; 1.4.5; 3.2 Detector systems, 2.3 Detergents, analysis of, 3.1.4 Diffusion transport of vapours, 1.4.2 Digestion methods, for soils, 3.1.2 Direct introduction of solids for ETA, 4.2.2.1 Direct sample injection, 4.1.2.2 Direct reading spectrometer, 2.3.3; T2.5A Discrete samples, nebulization of, 1.3.3; Double arc, 1.1.1.3 Droplet generator, 1.3.1 Dual-channel spectrometer, 2.4.1 for plants, 3.1.2 4.2.1.1 Echelle, monochromator, 1.3.1 ; 2.2.1 ; 2.4.1 Effluents, analysis of, T4.5'B Elcctrocorundum, analysis of, 4.3.2 EDLs, 2.1.2 spectrometer, 2.1.2; 4.5.2.3 for analysis, 1.2.2.3 for I and P, 2.1.2 pulsed, r.f.and microwave, 2.1.2 atomic emission, 1.4.4; 4.2.1.1; 4.5.2.3 atomic fluorescence, 1.4.4; 4.6.4 atomization processes in, 1.4.2 Electrothermal atomizers, T2.5D automatic sampling for, 2.4.2 direct introduction of solids, 4.2.2.1 for ICP, 1.2.1.3 for CMP, 1.2.2.4 graphite platform in, 1.4.1 metal coatings, 1.4.1; 1.4.2; 4.2.2.1; 4.5.2.2 pyrolytic graphite coatings, 1.4.1 ; 4.5.2.2 vapour temperature in, 1.4.2 Emission spectrometers, 2.4.1 ; T2.5A Emission spectrometry by GDL, 1.1.2 Emission spectrometry, data processing, Emulsification, 4.1.1.2 Evaporation, of droplets, 1.3.1 Excited state lifetime, determination of, Excitation mechanisms, 1.2.1.2 2.3.3 1.3.4.1 Faraday effect, I .4.1 Far-line wing, excitation, 1.3.1 absorption, 1.3.1 Feldspar, analysis of, T4.6 Fertilizers, analysis of, T4.6 Field ionization, 2.1.1 Filter spectrometers, 4.6.5 Firebrick, analysis of, 4.3.1 Fish tissue, analysis of, 4.7.3 Flame(s), air/C,H,, 1.3 air /C,H, /He, 1.3.1 air/H,, 1.3 composition, 1.3.2 N,O/C,H,, 1.3 0, / C2H, / Ar, 1.3.1 0, /C,H, /He, 1.3.1 O,/H,, 1.3 rise velocities in, 1.3.1 temperature, 1.3.1 Flow-rates in ICP, 1.2.1.2 Fly ash, analysis of, 4.5.3.1 Food, analysis of, 3.1.2; T4.7 Fourier transform, 2.2.2; 3.1.2 Freeze drying, 3.1.2 Fusion technique, 3.1.2 GC, detector for, 1.2.1.3; 1.2.1.6; 1.2.2.3; 1.2.3.2; 1.3.35; 1.4.5; 3.1.5; 4.1.1.3; 4.5.3.1; 4.5.3.3 Geological materials, analysis of, 1.1.1.3 Glass, analysis of, 4.3.3 Globule arc, 1.1.1.3Subject Zndex 27 1 GDL, 1.1.2; 4.2.1.1; 4.2.2.1 Graphite, platform, 1.4.1 rod atomizer, 1.2.1.3; 1.4.1 tube atomizer, 1.4.1 Grimm lamp, 1.1.2 Hollow-cathode atom cell, 1.1.2 Hollow cathode discharge, analysis by, HCL, 1.1.2; 2.1.2 high intensity, 2.1.2 pulsed, 2.1.2 HPLC, detector for, 4.5.1 Hydride generation, 1.2.1.3; 1.2.2.3; 1.5.1 ; 4.1.2.3 3.2.2.4; 4.5.2.3; 4.7.3; 4.8.3 ID, 2.3.2 Indirect determinations, 3.1.4 Individual atom detection, 2.1.1 Induction furnace, 1.2.2.4 ICP, 1.2.1; 2.4.1 applications of, 1.2.1.6; 4.2.1.1; 4.2.2.1; bibliography of, 1.2.1.1 reviews of, 1.2.1.1 4.4.2; 4.5.2.3; 4.6.5; 4.7.4; 4.8.4 Inhibition release titration, 3.2.2.1 Instruments, absorption, 2.4.2; 3.2.2.1 emission, 2.4.1 fluorescence, 2.4.3 Intensity distribution, in arcs, 1.1.1.1 Interferences, hydride generation, 1.5.1 in arcs, 1.1.1.2 in electrothermal atomizers, 1.4.2; 1.4.3 in flames, 1.3.2 in ICP, 1.2.1.5 Interferometers, 2.4.1 Instrumental artefacts, 3.2.3.2 Interlaboratory comparison, 3.2; 4.5.1 Internal standardization, 1.2.1 -2; 3.2 Iron, analysis of, 1.1.1.3 alloys, analysis of, 1.1.2; 1.3.2 ore, analysis of, 4.3.1 Kinetics of atomization in ETA, 1.4.2 Laser(s), 2.1.1 as light source in AFS, 1.3.4.1 enhanced AFS, 2.1.1 ionization, 2.1.1 micraprobe, 1.1.1.3 4.2.2.1; 4.8.4 with ICP, 1.2.1.3 Leaves, analysis of, 3.3.1 Line, overlap, 1.3.1 profile, 1.3.1 Liquid chromatography, 4.8.4 flame detector, 1.3.3; 3.1.5 plasma detector, 1.2.3.2 Low pressure discharge, 2.2.1 Magnesite, analysis of, 4.3.1 Magnetic field, effect on arcs, 1.1.1.1 Magnetically induced optical rotation, 2.4.4 Matrix effects, on arcs, 1.1.1.2 on GDL, 1.1.2 on ICP, 1.2.1.5 modification, 3.2.2.2 determination by cold-vapour technique, determination of in cylinder gases, 4.1.2.1 species in air, 4.5.3.1; 4.5.3.2 Metalloimmunoassay, 3.1.1 ; 4.8.3 Metals, analysis of, T4.2 Metal filament atomizers, 1.2.2.4'; 1.4.1 Metal oxides, analysis of, T4.3 Metastable energy transfer, 1.3.1 Michelson interferometer, 2.2.2 Microprocessor, instrument control with, 1.4.1; 2.3l.4; 2.4.2; 4.5.2.2 Microsampling cup, in flames, 1.3.3 Microwave plasma, 1.2.2; 4.5.3.3; 4.8.4 Minerals, analysis of, 1 1.3; T4.4 Mineral acids, analysis of, 4.1.2.1 Molecular, absorption, I .3.2; 1.4.5; 4.6.3 Mercury, determination of, 4.8.2 1.5.2; 4.8.3 cavities, 1.2.2.1; 1.2.2.2.2 emission cavity analysis (MECA), 1.3.3; 2.4.5 Molybdenum, oxides, analysis of, 4.3.2 Motor vehicle exhaust, analysis of, 3.1.5 Multi-element analysis, 1.2.1.4; 2.4.2 Nebulizer, for flames, 1.3.3 for graphite furnace, 1.4.1; 3.1.5 for ICP, 1.2.1.3; 3.1.5 effects, 1.2.1.5 4.7.1; 4.7.3 in ICP, 1.2.1.2 Neutron activation analysis, 4.6.2; 4.6.3; Noise, in flames, 1.3.2 Non-dispersive A F S , 2.1.2 Non-metals, determination of, 4.5.2.2 by ICP, 1.2.1.6273, Analytical Atomic Spectroscopy Oils, analysis of, 1.2.1.6; 3.1.2; 3.3.1; 4.1.1.1 wear metals in, 4.1.1.1; 4.1.1.2 Operating conditions, ICP, 1.2.1.2 Optics, 1.2.1.4;; 2.2.1 Optogalvanic detection, 1.3.4.2; 2.2.1 Ores, analysis of, 3.1.2 Organic, extracts, 3.1.3 solvents in flames, 1.3.1; 3.1.3 solvents in ICP, 1.2.1.4 Organo-mercury compounds, 4.7.1 analysis of, 4.5.2.1 Organo-metallic standards, T3.3C Organo-silicon compounds, determination of, Organo-sulphur compounds, 4.5.3.3 Oscillator strengths, 1.2.1.2; 1.3.1 4.5.2.2 Perchloric acid, 4.8.2 suppression effect of in ETA, 3.2.2.2 Petroleum, analysis of, 3.1.2; 3.1.5; T4.1A Phosphorus, analysis of, 3.1.5 determination of, 4.5.2.2 by ETA, 4.1.2.1 2.4.1 ; 4.5.2.2 Photodiode arrays, 1.2.1.2; 1.3.2; 2.3.2; Photographic detection, 2.3.3 Plants, analysis of, 1.1.3; 3.1.2; T4.6 Plasmas, 1.2 impedance, 1.2.1.4 Plasma ashing, 4.7.2 Plasma spectrometers, T2.5B Pneumatic nebulizers, 1.2.1.3 Pottery, analysis of, 4.3.3 Powders, analysis of, 1.1.1.3; 1.4.5 injection into plasmas, 1.2.1.2 Power, in ICP, 1.2.1.2 Precious metals, determination of, 4.4.2 Precision, 4.5.1 Preconcentration techniques, 4.4.2; 4.5.2.1 Pressure dissolution, 4.3.1; 4.3.2; 4.3.3 Pulsed, laser, 1.3.4.1 Pyrolytic coatings, for electrothermal nebulization, 1.3.3; 3.1.5 atomizers, 1.4.1 Reaction studies, 1.3.2 Reagents, 3.1.2; 3.1.3 Reference materials, 4.4.2; 4.7.1 ; 4.8.I Refractories, analysis of, T4.3 Releasing agents, 1.3.2 Resonance ionization spectroscopy, 1.3.4.3; R.f. plasmas, 1.2.1 Rocks, analysis of, 1.3.2 2.1.1 generators, 1.2.1.4 Safety, with NaBH,, 1.5.2 Sample introduction, for ICP, 1.2.1.3 for d.c.arc plasma, 1.2.3.1 Sample storage, 4.5.2.1 Saturation spectroscopy, 1.3.4.1 Scatter correction, 1.3.4.1 Sediments, analysis of, 4.5.2.1 Semiconductors, analysis of, 4.1.1.2; 4.. 1.2.3 Serum, analysis of, 4.8.1 Sewage, analysis of, 3.1.2; T4.5B sludges, analysis of, 4.5.1 ; 4.5.2.1 Signal-to-noise ratio, 1.2.1.2; 1.3.2; 3.2 Silica, analysis of, 4.3.1 brick, analysis of, 4.3.1 Silicates, dissolution of, 3.1.2 Silicon-intensified vidicon, 1.3.2 Silver, analysis of, 1.1.2 alloys, analysis of, 1.1.2 Simplex optimization, 3.2; 2.4.3 Single-atom detection, 2.I Slags, analysis of, T4.3 Sodium carbonate fusion, 4.6.2 Soils, analysis of, 1.1.3; 3.1 -2; T4.6 Solar blind photomultipliers, 4.6.4 Solid samples, analysis of, 1.3.3 Solid-state imaging deviccs, 2.3.2 Solvent extraction, 1.3.3; 3.1.3; 4.5.2.1; Spark atomization, for ICP, 1.2.1.3 Spark, discharge, 1 .l. 1 ; 4.2.1.1 waveform, 1.1.1.1 Speciation, 1.4.5; 4.5.1 Spectra of ICP, 1.2.1.2 ETA, 1.4.5; 3.1.5 4.6.2; 4.8.2 Spectral interferenccs, 1.2.1.4; 1.2.1.5 Spectrographic graphite electrodcs, T3.3A Spectrographic standards, T3.3D Sputtering, 1.1.2 Radioactive materials, analysis of, 4.1.2.3 Raman scattering, 1.3.1 Rapid scanning detectors, 2.3.2 Rare Earths, determination of, 4.3.2 cells, 1.1.2Subject Index 373 Standards, 3.3.1 ; 4.4.2; T3.3A; T3.3B; T3.3C; T3.3D Standard additions, 4.7.1 Steel, analysis of, 1.1.2; I .3.2 Stray light, 1.2.1.4; 1.2.1.5 Sulphur, determination in ICP, 1.2.1.6 Surface analysis by GDL, 1.1.4 Suspensions, direct analysis, 3.1.2 Temperature, in arcs and sparks, 1.1.1.1 ; 1.1.1.2 in ETAS, 1.4.2 in flames. 1.3.1 measurement of, 1.3.1 Thin films, analysis of, 1.1.1.3 Time resolved spectrometry, 1.3.1 Torchcs for TCP, 1.2.1.4 Total organic carbon, 3.1.4 Transient signals, 1.4.1 Transport mechanisms in ETA, 1.4.2 Tungsten, analysis of, 4.3.2 Two-photon processes, 2.1 Ultrasonic nebulizers, 1.2.1.3; 1.3.3; 3.2.2.3 Uranium, analysis of, 1.2.1.6 Vegetable oils, analysis of, 4.7.3 Vibrating refractor plate, 1.2.1.5 Vicinal diols, analysis of, 3.1.4 Vidicon tubes, 2.3.2 Waters, analysis of, 3.1.2; 3.3.2; 4.5.2; T4.5R Wavelength, modulation, 2.2.1; 2.4.3 Wet ashing, 3.1.2; 4.1.1.1; 4.1.2.1; 4.5.3.1; Wines, analysis of, 1.1.1.3; 3.3.2 standards, 1.3.1 4.6.2; 4.7.2; 4.8.2 Zeeman effect in AAS, 1.3.1; 1.4.3; 1.4.5; Zinc, analysis of. 1.1.1.2 2.2.1; 4.8.4