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Effect of a magnetic field on the gate current in heterostructure field‐effect transistors

 

作者: You‐jun Chen,   E. Dan Dahlberg,   M. Shur,   A. Akinwande,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 56, issue 20  

页码: 2028-2030

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.103007

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report the effect of relatively weak (classical) magnetic fields on the gate current in heterostructure field‐effect transistors. With a three‐terminal device using the measured dependences, we deduce an average electron velocity and the average concentration of the two‐dimensional (2‐d) electron gas in the channel. In addition, our results clearly show the onset of velocity saturation in high electric field. The value of the effective saturation velocity in the channel is of the order of 105m/s, in agreement with the values deduced from device transconductance.

 

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