A low temperature, ultrahigh vacuum, microwave‐frequency‐compatible scanning tunneling microscope
作者:
S. J. Stranick,
M. M. Kamna,
P. S. Weiss,
期刊:
Review of Scientific Instruments
(AIP Available online 1994)
卷期:
Volume 65,
issue 10
页码: 3211-3215
ISSN:0034-6748
年代: 1994
DOI:10.1063/1.1144551
出版商: AIP
数据来源: AIP
摘要:
To expand the capabilities of the microwave frequency alternating current scanning tunneling microscope to include the ability to study isolated adsorbates and highly reactive surfaces, we have developed a low temperature, ultrahigh vacuum alternating current scanning tunneling microscope. In this alternating current scanning tunneling microscope, we employ the reliable beetle‐style sample approach mechanism with a number of other components unique to a low temperature scanning tunneling microscope. These include the sample transfer, delivery, retrieval, storage, sputtering, and heating systems. This alternating current scanning tunneling microscope operates at 77 and 4 K.
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