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A low temperature, ultrahigh vacuum, microwave‐frequency‐compatible scanning tunneling microscope

 

作者: S. J. Stranick,   M. M. Kamna,   P. S. Weiss,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1994)
卷期: Volume 65, issue 10  

页码: 3211-3215

 

ISSN:0034-6748

 

年代: 1994

 

DOI:10.1063/1.1144551

 

出版商: AIP

 

数据来源: AIP

 

摘要:

To expand the capabilities of the microwave frequency alternating current scanning tunneling microscope to include the ability to study isolated adsorbates and highly reactive surfaces, we have developed a low temperature, ultrahigh vacuum alternating current scanning tunneling microscope. In this alternating current scanning tunneling microscope, we employ the reliable beetle‐style sample approach mechanism with a number of other components unique to a low temperature scanning tunneling microscope. These include the sample transfer, delivery, retrieval, storage, sputtering, and heating systems. This alternating current scanning tunneling microscope operates at 77 and 4 K.

 

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