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&Dgr;n=0.22birefringence measurement by surface emitting second harmonic generation in selectively oxidized GaAs/AlAs optical waveguides

 

作者: A. Fiore,   V. Berger,   E. Rosencher,   S. Crouzy,   N. Laurent,   J. Nagle,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 18  

页码: 2587-2589

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119336

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have measured the birefringence enhancement due to lateral selective oxidation of AlAs in GaAs/AlAs optical waveguides. The birefringence was measured by imaging the surface-emitted second harmonic generated by the nonlinear interaction of counterpropagating TE and TM modes. In a waveguide containing a single AlAs layer the birefringence is enhanced from&Dgr;n=0.017(before oxidation) to&Dgr;n=0.038(after oxidation). In an oxidized multilayer GaAs/AlAs waveguide, a birefringence as high as&Dgr;n=0.22is measured. This birefringence is sufficient to phase-match the difference frequency generation of 3–5 &mgr;m infrared radiation from two near-infrared pumps. ©1997 American Institute of Physics.

 

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