&Dgr;n=0.22birefringence measurement by surface emitting second harmonic generation in selectively oxidized GaAs/AlAs optical waveguides
作者:
A. Fiore,
V. Berger,
E. Rosencher,
S. Crouzy,
N. Laurent,
J. Nagle,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 18
页码: 2587-2589
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119336
出版商: AIP
数据来源: AIP
摘要:
We have measured the birefringence enhancement due to lateral selective oxidation of AlAs in GaAs/AlAs optical waveguides. The birefringence was measured by imaging the surface-emitted second harmonic generated by the nonlinear interaction of counterpropagating TE and TM modes. In a waveguide containing a single AlAs layer the birefringence is enhanced from&Dgr;n=0.017(before oxidation) to&Dgr;n=0.038(after oxidation). In an oxidized multilayer GaAs/AlAs waveguide, a birefringence as high as&Dgr;n=0.22is measured. This birefringence is sufficient to phase-match the difference frequency generation of 3–5 &mgr;m infrared radiation from two near-infrared pumps. ©1997 American Institute of Physics.
点击下载:
PDF
(486KB)
返 回