Excimer laser ablation processed ferroelectric and antiferroelectric thin films
作者:
S.B. Krupanidhi,
S. Saha,
S. Bhattacharyya,
S. S.N. Bharadwaja,
期刊:
Integrated Ferroelectrics
(Taylor Available online 2000)
卷期:
Volume 31,
issue 1-4
页码: 1-12
ISSN:1058-4587
年代: 2000
DOI:10.1080/10584580008215635
出版商: Taylor & Francis Group
关键词: BST;SBNT;PZ thin films
数据来源: Taylor
摘要:
The dielectric and electrical properties of excimer laser ablated processed paraelectric (Ba0.5, Sr0.5)TiO3, ferroelectric Bi-layered SrBi2(Ta0.5Nb0.5)2O9, and antiferroelectric (PbZrO3) thin films have been investigated. The effect of processing parameters on the microstructure of the films and the functional properties has been presented in detail. Some of the recent studies of stress induced effects, dielectric, hysteresis and ac and dc electrical properties have been highlighted in conjunction with microstructures of the films.
点击下载:
PDF (440KB)
返 回