A Lloyd mirror laser interferometer is described which determines the refractive index gradient in a diffusion layer. The interference fringe movement is detected by an array of n‐p‐n planar silicon photodevices the output of which is recorded by oscillographs. Various modes of measurement are discussed which are suitable for transparent or opaque electrodes. The presently used measuring mode is based on the determination of the reflected ray's optical path length change at various angles of incidence. The refractive index gradient is obtained by an iterative solution of the derived equation for the optical path length change on a digital computer. The time dependence of the fringe movement during electrodeposition from CuSO4solutions is discussed in addition to the effect of incidence angle and cathode displacement. The use of this interferometer is not limited to electrochemical processes and it can be used for the study of refractive index gradients in heat and other mass transfer boundary layers at solids.