The design of a scanning, single‐crystal, multichannel x‐ray spectrometer for spectrochemical analysis is discussed. This design makes use of two or more sets of reflecting planes in the same crystal, and an individual detector is used for each set of planes. Such an instrument permits the choice of optimum resolution and detection conditions for different spectral regions, without compromising source design and without the introduction of mechanical complexity. It is possible also to scan different portions of the spectrum simultaneously. The features of such an instrument are contrasted with other types of spectrochemical analysis instruments, and some results obtained using such an instrument are described.