Direct thermal conductance measurements on suspended monocrystalline nanostructures
作者:
T. S. Tighe,
J. M. Worlock,
M. L. Roukes,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 20
页码: 2687-2689
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118994
出版商: AIP
数据来源: AIP
摘要:
We describe and demonstrate a new class of devices that enabledirectthermal conductance measurements on monocrystalline nanostructures. These are possible through our newly developed techniques for three-dimensional, successive surface nanomachining of GaAs-based heterostructures. Our methods allow the patterning of complex devices comprising electrically insulating, mesoscopic thermal conductors with separate, thermal transducersin situ. Intimate thermal contact between these elements is provided by their epitaxial registry. Low-temperature thermal conductance measurements indicate that phonon boundary scattering in these initial nanometer is scale structures is partially specular. These devices offer promise for ultrasensitive bolometry and calorimetry. ©1997 American Institute of Physics.
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