首页   按字顺浏览 期刊浏览 卷期浏览 Direct thermal conductance measurements on suspended monocrystalline nanostructures
Direct thermal conductance measurements on suspended monocrystalline nanostructures

 

作者: T. S. Tighe,   J. M. Worlock,   M. L. Roukes,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 20  

页码: 2687-2689

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.118994

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We describe and demonstrate a new class of devices that enabledirectthermal conductance measurements on monocrystalline nanostructures. These are possible through our newly developed techniques for three-dimensional, successive surface nanomachining of GaAs-based heterostructures. Our methods allow the patterning of complex devices comprising electrically insulating, mesoscopic thermal conductors with separate, thermal transducersin situ. Intimate thermal contact between these elements is provided by their epitaxial registry. Low-temperature thermal conductance measurements indicate that phonon boundary scattering in these initial nanometer is scale structures is partially specular. These devices offer promise for ultrasensitive bolometry and calorimetry. ©1997 American Institute of Physics.

 

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