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Two-photon optical beam induced current imaging through the backside of integrated circuits

 

作者: Chris Xu,   Winfried Denk,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 18  

页码: 2578-2580

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119334

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Two-photon optical beam induced current (TOBIC) images were acquired through the polished backsides of integrated circuits. An excitation beam with a photon energy below the band gap can traverse even thick substrates virtually unattenuated. At the focus—and only there—two-photon absorption generates electron-hole pairs very efficiently when using a sub-picosecond light source. An additional advantage of TOBIC is a significant increase in spatial resolution. With high numerical aperture objective lense features smaller than 1 &mgr;m are easily discernible. ©1997 American Institute of Physics.

 

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