Two-photon optical beam induced current imaging through the backside of integrated circuits
作者:
Chris Xu,
Winfried Denk,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 18
页码: 2578-2580
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119334
出版商: AIP
数据来源: AIP
摘要:
Two-photon optical beam induced current (TOBIC) images were acquired through the polished backsides of integrated circuits. An excitation beam with a photon energy below the band gap can traverse even thick substrates virtually unattenuated. At the focus—and only there—two-photon absorption generates electron-hole pairs very efficiently when using a sub-picosecond light source. An additional advantage of TOBIC is a significant increase in spatial resolution. With high numerical aperture objective lense features smaller than 1 &mgr;m are easily discernible. ©1997 American Institute of Physics.
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