An Instrument for Studying the Topographies of Fine Textured Surfaces
作者:
F. W. Adams,
Lee Devol,
H. R. Letner,
期刊:
Review of Scientific Instruments
(AIP Available online 1941)
卷期:
Volume 12,
issue 8
页码: 409-411
ISSN:0034-6748
年代: 1941
DOI:10.1063/1.1769912
出版商: AIP
数据来源: AIP
摘要:
A profilograph, using a tracing point and optical lever system, makes profiles of fine textured surfaces, magnifying the elevations and depressions by as much as 6000×. With this instrument it is possible to detect surface variations as small as 0.04 micron. It is also possible to make a series of profiles along parallel paths from which topographic or relief maps can be prepared. Uses include the study of machined, lapped, and etched surfaces of importance in industry. The high accuracy is obtained with no more difficult machine work than the simultaneous lapping of two tapered bearings mounted on a single shaft. The use of torsion elements of special design for supporting the mirror makes the instrument relatively insensitive to vibration. These torsion elements are capable of supporting a mirror large enough to permit several reflections of the light beam, giving the instrument its high resolving power.
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