Facts and artifacts in near-field optical microscopy
作者:
B. Hecht,
H. Bielefeldt,
Y. Inouye,
D. W. Pohl,
L. Novotny,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 6
页码: 2492-2498
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.363956
出版商: AIP
数据来源: AIP
摘要:
Near-field optical (NFO) microscopes with an auxiliary gap width regulation (shear force, tunneling) may produce images that represent the path of the probe rather than optical properties of the sample. Experimental and theoretical evidence leads us to the conclusion that many NFO results reported in the past might have been affected or even dominated by the resulting artifact. The specifications derived from such results for the different types of NFO microscopes used therefore warrant reexamination. We show that the resolving power of aperture NFO microscopes, 30–50 nm, is of genuine NFO origin but can be heavily obscured by the artifact. ©1997 American Institute of Physics.
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