The revealing power of a test case
作者:
Jeffrey M. Voas,
Keith W. Miller,
期刊:
Software Testing, Verification and Reliability
(WILEY Available online 1992)
卷期:
Volume 2,
issue 1
页码: 25-42
ISSN:0960-0833
年代: 1992
DOI:10.1002/stvr.4370020105
出版商: John Wiley&Sons, Ltd
关键词: ‘Propagation Infection and Execution Analysis’ (PIE);Histogram;Mutation testing;Coverage criteria;Fault revealing ability;Probability;Software testing
数据来源: WILEY
摘要:
Abstract‘Propagation, infection, and execution analysis’ (termed PIE) is used for predicting where faults can more easily hide in software. To make such predictions, programs are dynamically executed with test cases, and information concerning the test cases is collected into a histogram, each bin of which represents a single test case. The score in a bin predicts the likelihood that the test case will reveal a fault through the production of a failure (if a fault exists in the set of program locations that the test case executes). Preliminary experiments using program mutations suggest that the histogram technique presented in this paper can rank test cases according to their fault revealing abil
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