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Resolution limits of optical lithography

 

作者: Shinji Okazaki,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1991)
卷期: Volume 9, issue 6  

页码: 2829-2833

 

ISSN:1071-1023

 

年代: 1991

 

DOI:10.1116/1.585650

 

出版商: American Vacuum Society

 

关键词: LITHOGRAPHY;SPATIAL RESOLUTION;INTEGRATED CIRCUITS;VISIBLE RADIATION;FABRICATION;LIMITING VALUES

 

数据来源: AIP

 

摘要:

The development of optical lithography has promoted the development of ultralarge scale integration (ULSI) devices. However, optical lithography is now facing serious obstacles due to the limitations in wavelength. Higher resolution with sufficient depth of focus is the most important requirement for ULSI engineers. To satisfy this requirement, many technologies for resolution improvement and new optical image formation technologies such as phase shifting and focus latitude enhancement exposure (FLEX) are reviewed, and a future perspective on optical lithography is also discussed in this paper.

 

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