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Potential distribution in the van der Pauw technique

 

作者: D. K. de Vries,   A. D. Wieck,  

 

期刊: American Journal of Physics  （AIP Available online 1995）
卷期: Volume 63, issue 12  

页码: 1074-1078

 

ISSN:0002-9505

 

年代: 1995

 

DOI:10.1119/1.18013

 

出版商: American Association of Physics Teachers

 

关键词: ASPECT RATIO;ELECTRIC CONDUCTIVITY;ELECTRIC POTENTIAL;HALL EFFECT;LAPLACE EQUATION;POLYETHYLENES

 

数据来源: AIP

 

摘要:

The van der Pauw technique for resistivity and Hall measurements is illustrated on large‐scale models of conductive polyethylene, which can be used to visualize the potential distribution in arbitrarily shaped two‐dimensional samples. The equipotential lines in a square sample and the dependence of measured voltages on the aspect ratio of these samples are studied. We give examples of the use of conformal mapping in two‐dimensional conduction.

 

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