SnO2by XPS

 

作者: Michael A. Stranick,   Anthony Moskwa,  

 

期刊: Surface Science Spectra  (AIP Available online 1993)
卷期: Volume 2, issue 1  

页码: 50-54

 

ISSN:1055-5269

 

年代: 1993

 

DOI:10.1116/1.1247724

 

出版商: American Vacuum Society

 

关键词: TIN OXIDES;PHOTOELECTRON SPECTROSCOPY;X RADIATION;POWDERS;POLYCRYSTALS;CORE LEVELS;CHEMICAL SHIFT;VALENCE BANDS;AES

 

数据来源: AIP

 

摘要:

Tin and various tin compounds have wide utility in coatings, electronics, and catalysts, as well as having numerous biological applications. Distinguishing between different tin compounds on surfaces is an important aspect of research in many of these disciplines. In this work, x-ray photoelectron spectroscopy has been used to obtain comparison spectra of a high purity SnO2powder. Due to rather small core level chemical shifts, it has been shown that differences in the valence band spectra provide the most direct method of distinguishing between SnO2and SnO using XPS [see J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys. Rev. B46, 2460 (1992); P. M. A. Sherwood,ibid.41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol.15, 622 (1978)]. The separation between the Sn 4dcore level line and the most intense Sn valence band peak is also characteristic of Sn oxides [see J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys. Rev. B46, 2460 (1992) and P. M. A. Sherwood,ibid.41, 10151 (1990)]. The valence band spectrum and the valence band–Sn 4dseparation reported in this work are consistent with literature data [see J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys., Rev. B46, 2460 (1992); P. M. Sherwood,ibid.41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol.15, 622 (1978)]. Auger parameter data may also prove useful for distinguishing between various tin compounds on surfaces. Thus, in addition to core level spectra, valence band and x-ray excited Auger spectra for SnO2are presented. Data were obtained with a Perkin-Elmer Physical Electronics model 5600 photoelectron spectrometer using monochromatic radiation.

 

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