Electroreflectance of Ag/GaAs
作者:
Dong‐Po Wang,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1994)
卷期:
Volume 12,
issue 6
页码: 3103-3106
ISSN:1071-1023
年代: 1994
DOI:10.1116/1.587485
出版商: American Vacuum Society
关键词: SCHOTTKY BARRIER DIODES;GALLIUM ARSENIDES;SILVER;ELECTROREFLECTANCE;VOLTAGE DEPENDENCE;FRANZ−KELDYSH EFFECT;AMBIENT TEMPERATURE;DEPLETION LAYERS;CARRIER DENSITY;Ag;GaAs
数据来源: AIP
摘要:
The electroreflectance (ER) spectra of Schottky‐barrier Ag/GaAs have been measured at various dc bias voltages (Vbias). It is known that the surface electric field can be deduced from the period of the Franz–Keldysh oscillations (FKO) of ER. Therefore, the built‐in voltage (Vbi) and the carrier concentration in the depletion region can be calculated by the assumption of a constant charge distribution in the depletion region. In this article, we show thatVbican also be determined from the amplitude of the FKO as a function ofVbiasin the forward biased region. TheVbidetermined by the above two different methods have been verified to be in good agreement.
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