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Preprocessing of data from spreading-resistance measurements

 

作者: J.van Linschoten,   J.Snijder,   M.W.Hillen,  

 

期刊: IEE Proceedings I (Solid-State and Electron Devices)  (IET Available online 1980)
卷期: Volume 127, issue 2  

页码: 100-104

 

年代: 1980

 

DOI:10.1049/ip-i-1.1980.0019

 

出版商: IEE

 

数据来源: IET

 

摘要:

Spreading-resistance measurements often exhibit a lot of noise which can hinder their analysis. A method is presented for automated elimination of strongly deviating values, and smoothing of the resistance curve, leading in a few filter steps to a more accurate determination of the concentration profile. It is shown that the accuracy of the spreading-resistance technique can be increased by combining several profiles of a sample.

 

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