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Review of scanning force microscopy

 

作者: Dror Sarid,   Virgil Elings,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  （AIP Available online 1991）
卷期: Volume 9, issue 2  

页码: 431-437

 

ISSN:1071-1023

 

年代: 1991

 

DOI:10.1116/1.585585

 

出版商: American Vacuum Society

 

关键词: ATOMIC FORCE MICROSCOPY;ELECTROSTATICS;INTERATOMIC FORCES;DETECTION;REVIEWS;USES;SCANNING FORCE MICROSCOPY

 

数据来源: AIP

 

摘要:

We present an overview of scanning force microscopy with applications to electrostatic, magnetostatic, and atomic forces operating in the contact and noncontact mode, and highlight the main achievements in this field.

 

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