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Silicon‐to‐silicon direct bonding method

 

作者: M. Shimbo,   K. Furukawa,   K. Fukuda,   K. Tanzawa,  

 

期刊: Journal of Applied Physics  (AIP Available online 1986)
卷期: Volume 60, issue 8  

页码: 2987-2989

 

ISSN:0021-8979

 

年代: 1986

 

DOI:10.1063/1.337750

 

出版商: AIP

 

数据来源: AIP

 

摘要:

It was found that strong bonding takes place when a pair of clean, mirror‐polished silicon surfaces are contacted at room temperature after hydrophilic surface formation. Bonding strength reaches the fracture strength of silicon bulk after heating above 1000 °C. Electric resistivity at the interface is less than 10−6&OHgr;/cm2. Bondingp‐type silicon ton‐type silicon forms a diode. The reaction between silanol groups formed on the surface may cause the bonding force. Heating above 1000 °C was thought to diffuse oxygen to inside the silicon bulk, forming an epitaxial‐like lattice continuity at the interface.

 

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