Temperature dependence of the lasing threshold current of double heterostructure injection lasers due to drift current loss
作者:
P. J. Anthony,
N. E. Schumaker,
期刊:
Journal of Applied Physics
(AIP Available online 1980)
卷期:
Volume 51,
issue 9
页码: 5038-5040
ISSN:0021-8979
年代: 1980
DOI:10.1063/1.328385
出版商: AIP
数据来源: AIP
摘要:
Contact‐limited, ambipolar transport, which describes the drift current behavior of minority carriers not confined to the active layer of double heterostructure injection lasers, is used to predict different behavior than previous calculations for the temperature dependence of the threshold current for lasing. The high‐temperature coefficients of some lasers may more easily be explained using the model.
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