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Temperature dependence of the lasing threshold current of double heterostructure injection lasers due to drift current loss

 

作者: P. J. Anthony,   N. E. Schumaker,  

 

期刊: Journal of Applied Physics  (AIP Available online 1980)
卷期: Volume 51, issue 9  

页码: 5038-5040

 

ISSN:0021-8979

 

年代: 1980

 

DOI:10.1063/1.328385

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Contact‐limited, ambipolar transport, which describes the drift current behavior of minority carriers not confined to the active layer of double heterostructure injection lasers, is used to predict different behavior than previous calculations for the temperature dependence of the threshold current for lasing. The high‐temperature coefficients of some lasers may more easily be explained using the model.

 

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