Using a new ultrasonic method which relies on the measurement of the in‐phase and quadrature components of a continuous ultrasonic excitation as a function of position, we have measured the flexural modulus of composition modulated Cu‐Ni self‐supporting thin films. For some of the films, we have also observed the shear (Sz) modulus (allowing the calculation of the biaxial and Young’s moduli). No enhancement of these moduli was observed for composition wavelengths in the range of 17–40 A˚.