Calculation of bulk states contributions to field emission from GaN
作者:
M. S. Chung,
B.-G. Yoon,
J. M. Park,
P. H. Cutler,
N. M. Miskovsky,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1998)
卷期:
Volume 16,
issue 2
页码: 906-909
ISSN:1071-1023
年代: 1998
DOI:10.1116/1.589928
出版商: American Vacuum Society
关键词: GaN
数据来源: AIP
摘要:
The field emission current from ann-type GaN is theoretically calculated as a function of carrier concentrationn.The obtained emission current densityjincreases slowly with increasingneven though the band bending has the oppositendependence. In evaluating thendependence of field emission, the internal voltage drop due to field penetration is found to be crucial. The current densityjis also calculated for several electron affinities χ. It seems that at the lowest χ and at high field,F,the calculated emission currents from the bulk states can be close to the measured values. The electric field at the GaN conical tip is found to be very high in the large area and yield such a large emission current as measured in experiment.
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