Detection of the EL2 metastability by x‐ray rocking‐curve measurements at low temperatures
作者:
G. Kowalski,
M. Leszczynski,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 59,
issue 20
页码: 2561-2563
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.105953
出版商: AIP
数据来源: AIP
摘要:
X‐ray experiments are usually seen as a tool for studying large lattice imperfections. We present for the first time experimental evidence obtained from x‐ray measurements that metastable behavior of the EL2 defect in semi‐insulating GaAs can be connected with crystal lattice relaxation. New unexpected results showing change of the lattice state while cooling semi‐insulating GaAs samples in darkness are also reported.
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