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Dynamic Release Control Policy for the Semiconductor Wafer Fabrication Lines

 

作者: KimJongsoo,   LeachmanRobert C.,   SuhByungkyoo,  

 

期刊: Journal of the Operational Research Society  (Taylor Available online 1996)
卷期: Volume 47, issue 12  

页码: 1516-1525

 

ISSN:0160-5682

 

年代: 1996

 

DOI:10.1057/jors.1996.195

 

出版商: Taylor&Francis

 

关键词: release control;semiconductor fabrication

 

数据来源: Taylor

 

摘要:

AbstractWe propose a policy for controlling the release of raw wafers into semiconductor wafer fabrication lines. The proposed policy exploits up-to-date factory floor information gathered by tracking systems in order to calculate the timing and amount of new releases to minimize mean flow times and mean tardiness while maintaining the maximum output rates of the system. Extensive computer experiments show that the proposed policy results in at least 23.0 and 17.9% improvements on average in mean waiting time and mean tardiness respectively compared to existing release rules.

 

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