Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability
作者:
WilliamQ. Meeker,
GeraldJ. Hahn,
期刊:
Technometrics
(Taylor Available online 1977)
卷期:
Volume 19,
issue 4
页码: 381-399
ISSN:0040-1706
年代: 1977
DOI:10.1080/00401706.1977.10489577
出版商: Taylor & Francis Group
关键词: Life testing;Accelerated testing;Reliability;Logistic model
数据来源: Taylor
摘要:
This paper is concerned with the optimum allocation of test units to overstress conditions when it is desired to estimate the survival probability at a design condition with a low expected failure probability. The criterion is that of minimizing the large sample variance: a logistic model is assumed. Expressions and charts for allocating test units to the accelerated stresses are provided and procedures for determining the stresses when these are not all specified are given. The gain in efficiency from using these plans versus testing exclusively at the design condition is analyzed. The requirement for some testing at the design stress and at an intermediate stress is also considered.
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