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Ion impact etch anisotropy downstream from diffusion plasma sources

 

作者: M. J. Goeckner,   J. Goree,   T. E. Sheridan,  

 

期刊: Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films  (AIP Available online 1991)
卷期: Volume 9, issue 6  

页码: 3178-3180

 

ISSN:0734-2101

 

年代: 1991

 

DOI:10.1116/1.577142

 

出版商: American Vacuum Society

 

关键词: ANISOTROPY;ETCHING;ION TEMPERATURE;PLASMA SOURCES;ION BEAMS;SUBSTRATES;FLUORESCENCE;ELECTRON CYCLOTRON−RESONANCE

 

数据来源: AIP

 

摘要:

Plasma processing in chambers located downstream from a source are gaining widespread use because they allow etching and deposition with minimal damage. This minimized damage, however, is achieved by using a low ion impact energy, which can lead to a poorer etch anisotropy. The best anisotropy for a given impact energy requires the lowest possible ion temperature. Laser‐induced fluorescence measurements show that room temperature ions can be attained using a multidipole‐confined discharge. In comparison, ion temperatures downstream from electron cyclotron resonance sources are much hotter, according to recent reports.

 

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