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An electron beam lithography system for submicron VHSIC device fabrication

 

作者: H. J. King,   P. E. Merritt,   O. W. Otto,   F. S. Ozdemir,   John Pasiecznik,   A. M. Carroll,   D. L. Cavan,   W. Eckes,   L. H. Lin,   L. Veneklasen,   J. C. Wiesner,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena  (AIP Available online 1985)
卷期: Volume 3, issue 1  

页码: 106-111

 

ISSN:0734-211X

 

年代: 1985

 

DOI:10.1116/1.583189

 

出版商: American Vacuum Society

 

关键词: ELECTRON BEAMS;FABRICATION;INTEGRATED CIRCUITS;LITHOGRAPHY;RESOLUTION;WAFERS;DESIGN;BEAM OPTICS

 

数据来源: AIP

 

摘要:

A direct write electron beam lithography system has been constructed which is capable of writing 0.5 μm VHSIC patterns at a rate of 4 to 25 four−inch wafer levels per hour. The several key subsystems which permit this increase in performance over existing systems are (1) A variable shaped beam which exposes rectangular or triangular shapes from 0.5 to 2.0 μm in size at a current density up to 200 A/cm2; (2) an all digital, 100 MHz pattern generator with optical couplers for high speed, low noise data processing; (3) a unique deflection system with specially designed 18 bit digital to analog converters and ultralinear amplifiers; (4) a mechnaical state capable of 10 cm/s speed and 0.8 g acceleration, under microprocessor control, providing write‐while‐moving capability and synchronization with the pattern generator; and (5) a wafer handler system for cassette‐to‐cassette input/output; and (6) a complimentary software package which constructs files with the necessary data compaction for rapid transmission and proximity correction for proper exposure.

 

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