An electron beam lithography system for submicron VHSIC device fabrication
作者:
H. J. King,
P. E. Merritt,
O. W. Otto,
F. S. Ozdemir,
John Pasiecznik,
A. M. Carroll,
D. L. Cavan,
W. Eckes,
L. H. Lin,
L. Veneklasen,
J. C. Wiesner,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena
(AIP Available online 1985)
卷期:
Volume 3,
issue 1
页码: 106-111
ISSN:0734-211X
年代: 1985
DOI:10.1116/1.583189
出版商: American Vacuum Society
关键词: ELECTRON BEAMS;FABRICATION;INTEGRATED CIRCUITS;LITHOGRAPHY;RESOLUTION;WAFERS;DESIGN;BEAM OPTICS
数据来源: AIP
摘要:
A direct write electron beam lithography system has been constructed which is capable of writing 0.5 μm VHSIC patterns at a rate of 4 to 25 four−inch wafer levels per hour. The several key subsystems which permit this increase in performance over existing systems are (1) A variable shaped beam which exposes rectangular or triangular shapes from 0.5 to 2.0 μm in size at a current density up to 200 A/cm2; (2) an all digital, 100 MHz pattern generator with optical couplers for high speed, low noise data processing; (3) a unique deflection system with specially designed 18 bit digital to analog converters and ultralinear amplifiers; (4) a mechnaical state capable of 10 cm/s speed and 0.8 g acceleration, under microprocessor control, providing write‐while‐moving capability and synchronization with the pattern generator; and (5) a wafer handler system for cassette‐to‐cassette input/output; and (6) a complimentary software package which constructs files with the necessary data compaction for rapid transmission and proximity correction for proper exposure.
点击下载:
PDF
(431KB)
返 回