Observation of Hg diffusion in CdTe by means of 40‐MeV O5+ion backscattering
作者:
K. Takita,
K. Murakami,
H. Otake,
K. Masuda,
S. Seki,
H. Kudo,
期刊:
Applied Physics Letters
(AIP Available online 1984)
卷期:
Volume 44,
issue 10
页码: 996-998
ISSN:0003-6951
年代: 1984
DOI:10.1063/1.94595
出版商: AIP
数据来源: AIP
摘要:
The diffusion profile of Hg in CdTe crystals was observed by means of heavy ion (40 MeV O5+) backscattering. The near‐surface region of CdTe immersed in Hg was investigated up to 1.4 &mgr;m from the surface. The observed Hg profile indicated that the concentration of Hg atom at the surface reached 4×1020cm−3and the distribution was interpreted by a simple diffusion model. Temperature dependence of the diffusion coefficient was determined to beD=5×103 exp[(−2.0±0.3) eV/kT] (cm2/s). In the case of CdTe immersed in Hg which contained a small amount of Cd, it was found that Hg diffusion did not occur. These experimental facts suggest that the rate of Hg diffusion is controlled by the diffusion of a Cd vacancy which is introduced by the outdiffusion of Cd atoms from CdTe crystals.
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