首页   按字顺浏览 期刊浏览 卷期浏览 Observation of Hg diffusion in CdTe by means of 40‐MeV O5+ion backscattering
Observation of Hg diffusion in CdTe by means of 40‐MeV O5+ion backscattering

 

作者: K. Takita,   K. Murakami,   H. Otake,   K. Masuda,   S. Seki,   H. Kudo,  

 

期刊: Applied Physics Letters  (AIP Available online 1984)
卷期: Volume 44, issue 10  

页码: 996-998

 

ISSN:0003-6951

 

年代: 1984

 

DOI:10.1063/1.94595

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The diffusion profile of Hg in CdTe crystals was observed by means of heavy ion (40 MeV O5+) backscattering. The near‐surface region of CdTe immersed in Hg was investigated up to 1.4 &mgr;m from the surface. The observed Hg profile indicated that the concentration of Hg atom at the surface reached 4×1020cm−3and the distribution was interpreted by a simple diffusion model. Temperature dependence of the diffusion coefficient was determined to beD=5×103 exp[(−2.0±0.3) eV/kT] (cm2/s). In the case of CdTe immersed in Hg which contained a small amount of Cd, it was found that Hg diffusion did not occur. These experimental facts suggest that the rate of Hg diffusion is controlled by the diffusion of a Cd vacancy which is introduced by the outdiffusion of Cd atoms from CdTe crystals.

 

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