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Transport critical current density and microstructure in extruded YBa2Cu3O7−xwires processed by zone melting

 

作者: Donglu Shi,   H. Krishnan,   J. M. Hong,   D. Miller,   P. J. McGinn,   W. H. Chen,   Ming Xu,   J. G. Chen,   M. M. Fang,   U. Welp,   M. T. Lanagan,   K. C. Goretta,   J. T. Dusek,   J. J. Picciolo,   U. Balachandran,  

 

期刊: Journal of Applied Physics  （AIP Available online 1990）
卷期: Volume 68, issue 1  

页码: 228-232

 

ISSN:0021-8979

 

年代: 1990

 

DOI:10.1063/1.347122

 

出版商: AIP

 

数据来源: AIP

 

摘要:

YBa2Cu3O7−xcompounds were extruded into long wires with the diameter of 1 mm after sintering. The sintered wires were subsequently zone melted to develop a highly textured microstructure. Magnetization experiments at 77 K indicated aJcvalue of 1×105A/cm2at 1 T. Transport measurements at 77 K showed a greatly enhanced field dependence of the critical current density. Transmission electron microscopy revealed an important grain‐boundary feature which eliminated the weak‐link behavior. Large amounts of dislocations have also been found in the zone‐melted sample which may contribute to flux pinning in the system.

 

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