Self‐Diffusion in Pure Polycrystalline Silver
作者:
L. Slifkin,
D. Lazarus,
T. Tomizuka,
期刊:
Journal of Applied Physics
(AIP Available online 1952)
卷期:
Volume 23,
issue 9
页码: 1032-1034
ISSN:0021-8979
年代: 1952
DOI:10.1063/1.1702341
出版商: AIP
数据来源: AIP
摘要:
Self‐diffusion in pure polycrystalline silver has been measured using Ag110as a tracer. The results of the high temperature experiments, where volume diffusion is predominant, are in excellent agreement with those of other investigators. A least‐squares calculation using all available data on volume diffusion of silver gives as a value for the diffusion coefficientD=0.724e−45, 500/RT. The occurence at low temperatures of grain boundary diffusion, in which the activity decreases exponentially with the first power of the penetration depth, as reported by Hoffman and Turnbull, is confirmed.
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