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Self‐Diffusion in Pure Polycrystalline Silver

 

作者: L. Slifkin,   D. Lazarus,   T. Tomizuka,  

 

期刊: Journal of Applied Physics  (AIP Available online 1952)
卷期: Volume 23, issue 9  

页码: 1032-1034

 

ISSN:0021-8979

 

年代: 1952

 

DOI:10.1063/1.1702341

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Self‐diffusion in pure polycrystalline silver has been measured using Ag110as a tracer. The results of the high temperature experiments, where volume diffusion is predominant, are in excellent agreement with those of other investigators. A least‐squares calculation using all available data on volume diffusion of silver gives as a value for the diffusion coefficientD=0.724e−45, 500/RT. The occurence at low temperatures of grain boundary diffusion, in which the activity decreases exponentially with the first power of the penetration depth, as reported by Hoffman and Turnbull, is confirmed.

 

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