A Class of Multiple Run Sampling Plans
作者:
LonnieC. Vance,
GaryC. McDonald,
期刊:
Technometrics
(Taylor Available online 1979)
卷期:
Volume 21,
issue 2
页码: 141-146
ISSN:0040-1706
年代: 1979
DOI:10.1080/00401706.1979.10489744
出版商: Taylor & Francis Group
关键词: Attribute sampling plans;Theory of runs;OC curves;Average sample number;Variance of sample number
数据来源: Taylor
摘要:
This article presents a class of attribute sampling plans based on the theory of runs. These plans call for the acceptance of a process if a run of specified length of nondefective items occurs before a fixed number of defectives have been observed. Recursion formulas for the probabilities of rejection and acceptance at each stage of sampling are derived. The operating characteristic (OC) curves, the average sample number (ASN) curves. and the variance of sample number (VSN) curves are given for representative plans within the class. This new class of plans is compared with a sequential plan and with a related sampling plan, also based on the theory of runs, which accepts a process if a run of specified length of nondefective items occurs in a fixed number of trials.
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