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A Class of Multiple Run Sampling Plans

 

作者: LonnieC. Vance,   GaryC. McDonald,  

 

期刊: Technometrics  (Taylor Available online 1979)
卷期: Volume 21, issue 2  

页码: 141-146

 

ISSN:0040-1706

 

年代: 1979

 

DOI:10.1080/00401706.1979.10489744

 

出版商: Taylor & Francis Group

 

关键词: Attribute sampling plans;Theory of runs;OC curves;Average sample number;Variance of sample number

 

数据来源: Taylor

 

摘要:

This article presents a class of attribute sampling plans based on the theory of runs. These plans call for the acceptance of a process if a run of specified length of nondefective items occurs before a fixed number of defectives have been observed. Recursion formulas for the probabilities of rejection and acceptance at each stage of sampling are derived. The operating characteristic (OC) curves, the average sample number (ASN) curves. and the variance of sample number (VSN) curves are given for representative plans within the class. This new class of plans is compared with a sequential plan and with a related sampling plan, also based on the theory of runs, which accepts a process if a run of specified length of nondefective items occurs in a fixed number of trials.

 

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