Depletion-capacitance-induced distortion in surface-channel c.c.d. transversal filters
作者:
C.P.Traynar,
J.D.E.Beynon,
P.C.T.Roberts,
J.Pennock,
期刊:
IEE Journal on Solid-State and Electron Devices
(IET Available online 1977)
卷期:
Volume 1,
issue 3
页码: 73-80
年代: 1977
DOI:10.1049/ij-ssed.1977.0008
出版商: IEE
数据来源: IET
摘要:
The effects of depletion-capacitance-induced distortion in split-electrode surface-channel c.c.d. transversal filters are analysed. Two standard charge-inputting techniques (the ‘diode cut off’ and ‘fill and spill’ schemes) and the two usual tapping methods (voltage and current sensing) are considered. The analysis of each input-output combination is used to predict the performance of a lowpass c.c.d. filter. Ignoring charge partitioning, the diode-cut off scheme, in conjunction with current sensing, provides an overall response which is linear. If charge partitioning is significant, however, a filter employing a fill-and-spill scheme in conjunction with current sensing gives the least distortion.
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