首页   按字顺浏览 期刊浏览 卷期浏览 Depletion-capacitance-induced distortion in surface-channel c.c.d. transversal filters
Depletion-capacitance-induced distortion in surface-channel c.c.d. transversal filters

 

作者: C.P.Traynar,   J.D.E.Beynon,   P.C.T.Roberts,   J.Pennock,  

 

期刊: IEE Journal on Solid-State and Electron Devices  (IET Available online 1977)
卷期: Volume 1, issue 3  

页码: 73-80

 

年代: 1977

 

DOI:10.1049/ij-ssed.1977.0008

 

出版商: IEE

 

数据来源: IET

 

摘要:

The effects of depletion-capacitance-induced distortion in split-electrode surface-channel c.c.d. transversal filters are analysed. Two standard charge-inputting techniques (the ‘diode cut off’ and ‘fill and spill’ schemes) and the two usual tapping methods (voltage and current sensing) are considered. The analysis of each input-output combination is used to predict the performance of a lowpass c.c.d. filter. Ignoring charge partitioning, the diode-cut off scheme, in conjunction with current sensing, provides an overall response which is linear. If charge partitioning is significant, however, a filter employing a fill-and-spill scheme in conjunction with current sensing gives the least distortion.

 

点击下载:  PDF (833KB)



返 回