Dielectric screening by cavities and the method of images
作者:
W. M. Saslow,
期刊:
American Journal of Physics
(AIP Available online 1990)
卷期:
Volume 58,
issue 7
页码: 639-641
ISSN:0002-9505
年代: 1990
DOI:10.1119/1.16423
出版商: American Association of Physics Teachers
关键词: SCREENING;IMAGE FORCE;DIELECTRIC MATERIALS;MULTIPOLES;ELECTROSTATICS;ELECTRIC POTENTIAL
数据来源: AIP
摘要:
A bare multipole potential Φ(r)=(A/rl+1)Pl(cos θ), concentric with a spherical cavity embedded within a dielectric, has its potential within the dielectric changed, not by the factor ε−1, but rather by the factorF(l)=(2l+1)/[l+(l+1)ε]. Moreover, a multipole source potential in the dielectric Φ(r)=(Arl)Pl(cos θ) has its potential within a concentric spherical cavity changed by a factor εF(l). The result is that the interaction between two multipoles in widely separated cavities is modified by a factor ε−1times a factor εF(l) for each multipole. By decomposing the bare potential of a point monopole source into its cavity multipole components, screening each component separately, and then resumming, it is shown why the method of images works both for point charges with semi‐infinite dielectrics and for line charges with dielectric circular cylinders—butnotfor point changes with dielectric spheres.
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