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Measuring Device for Diffraction Patterns

 

作者: Maynard J. Columbe,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1959）
卷期: Volume 30, issue 3  

页码: 181-182

 

ISSN:0034-6748

 

年代: 1959

 

DOI:10.1063/1.1716504

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A device for accurate measurement of diffraction patterns is described in detail. The accuracy of measurement is better than 0.01%. In addition, this device is useful for viewing photographic negatives and can also be used for other kinds of measurements.

 

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