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The Illuminating System of the Electron Microscope

 

作者: James Hillier,   S. G. Ellis,  

 

期刊: Journal of Applied Physics  (AIP Available online 1949)
卷期: Volume 20, issue 7  

页码: 700-706

 

ISSN:0021-8979

 

年代: 1949

 

DOI:10.1063/1.1698511

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Using a self‐biased electron gun the current arriving at the specimen, the current density at the specimen, and the area of illumination of the specimen have been determined for different values of the filament height. The variation of current density at the specimen with angular aperture of illumination has been determined and the results compared with those for the zero‐biased gun. The performance of the self‐biased gun is assessed and some of the factors involved in its operation and maintenance are discussed.

 

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