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Ion implantation :A new method of doping semiconductors–I

 

作者: L.N. Large,  

 

期刊: Contemporary Physics  (Taylor Available online 1969)
卷期: Volume 10, issue 3  

页码: 277-298

 

ISSN:0010-7514

 

年代: 1969

 

DOI:10.1080/00107516908224597

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

A novel method for doping semiconductors is ion implantation where impurities are injected in the form of high-energy ions. The range of these ions is well defined and is a function of ion energy and mass, the nature of the crystel and its orientation to the beam. In addition to its application to semiconductor device manufacture, ion implantation involves a good deal of interesting physics over a wide field, and in order to include the important aspect the article hes been divided into two parts.

 

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