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Double Sample Tests for Hypotheses about the Mean of an Exponential Distribution

 

作者: WilliamG. Bulgren,   JohnE. Hewett,  

 

期刊: Technometrics  （Taylor Available online 1973）
卷期: Volume 15, issue 1  

页码: 187-190

 

ISSN:0040-1706

 

年代: 1973

 

DOI:10.1080/00401706.1973.10489022

 

出版商: Taylor & Francis Group

 

关键词: Exponential Scale Parameter;Order Statistics;Double Sample Test

 

数据来源: Taylor

 

摘要:

In this note it is shown how the methodology of the Zeigler and Tietjen double sample test for testing a hypothesis about the variance of a normal distribution can be used to construct double sample tests for testing hypotheses about the mean of an exponential distribution.

 

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