High pressure X ray diffraction studies of rare earth doped Bi 2212 system
作者:
Ravhi S. Kumar,
A. Sekar,
N. Victor Jaya,
S. Natarajan,
期刊:
AIP Conference Proceedings
(AIP Available online 1999)
卷期:
Volume 483,
issue 1
页码: 265-267
ISSN:0094-243X
年代: 1999
DOI:10.1063/1.59624
出版商: AIP
数据来源: AIP
摘要:
High pressure X ray diffraction studies up to 15GPa were performed on the Y doped Bi2212 compound with the rare earth concentrationx=0.1at the calcium site. From the studies it has been found that the system remains in the orthorhombic structure up to 15GPa. The relative volume is found to decrease around 15GPa. This may be a positive indication for a pressure induced structural transition in the system beyond 15GPa. ©1999 American Institute of Physics.
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