Eddy current testing by upgraded microloop magnetic sensor array
作者:
Mitsuru Uesaka,
Kazumi Hakuta,
Kenzo Miya,
Kazuhiko Aoki,
Ayumu Takahashi,
期刊:
Electrical Engineering in Japan
(WILEY Available online 1996)
卷期:
Volume 116,
issue 1
页码: 80-93
ISSN:0424-7760
年代: 1996
DOI:10.1002/eej.4391160108
出版商: Wiley Subscription Services, Inc., A Wiley Company
关键词: Eddy current;micro‐eddy current;microloop magnetic sensor array
数据来源: WILEY
摘要:
AbstractA micro‐eddy current testing (ECT) probe, which consists of a planar microloop inductive magnetic sensor array and a pancake‐type exciting coil, was developed to upgrade the ECT technology, especially as it is used for inspecting steam generator tubing in a pressurized nuclear power plant (PWR). Eddy currents and resultant magnetic fields are perturbed due to a flaw in a conductor. The flaw is detected via perturbation of the electromotive force (EMF) and phase from the array. Flaws manufactured by electric discharge machining in INCONEL 600 planar specimens, the thickness of which was 1.25 mm, were detected and reconstructed by using stacked database and simplified algorithm. Even an outer‐edged 10 percent flaw could be detected. Measured EMF and phase signals were compared with numerical results obtained by using a three‐dimensional eddy current and field analysis code and then verified. The experiment confirmed that the spatial resolution of detection of the micro‐ECT probe is superior to that of the conventional pancake‐type ECT probe. Finally, it was demonstrated that it is possible to establish the same measurement speed using the micro‐ECT probe as it is by using the pancake
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