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Theory of elastic tip–surface interactions in atomic force microscopy

 

作者: Gregor Overney,   Weiqing Zhong,   David Tománek,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  （AIP Available online 1991）
卷期: Volume 9, issue 2  

页码: 479-482

 

ISSN:1071-1023

 

年代: 1991

 

DOI:10.1116/1.585550

 

出版商: American Vacuum Society

 

关键词: ATOMIC FORCE MICROSCOPY;DEFORMATION;ELASTIC CONSTANTS;AB INITIO CALCULATIONS;GRAPHITE;INTERACTIONS;FRICTION;RESOLUTION

 

数据来源: AIP

 

摘要:

We present a first‐principles study of elastic surface deformations, limits of atomic resolution, and of atomic‐scale friction in atomic force microscopy (AFM). In the case of a Pd AFM tip interacting with a graphite surface, we find that atomic resolution can be achieved in a narrow load range near ≊10−8N (per Pd tip atom). For these loads, we determine the microscopic friction coefficient to be μ≊10−2.

 

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