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Variation of secondary ion emission yield with atomic concentrations of Fe, Ni, and Cr ...
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Variation of secondary ion emission yield with atomic concentrations of Fe, Ni, and Cr ternary alloys and oxides: Application to the analysis of thin oxide films
作者:
J. C. Pivin,
C. Roques‐Carmes,
G. Slodzian,
期刊:
Journal of Applied Physics
(AIP Available online 1980)
卷期:
Volume 51,
issue 8
页码: 4158-4163
ISSN:0021-8979
年代: 1980
DOI:10.1063/1.328273
出版商: AIP
数据来源: AIP
摘要:
For binary and ternary alloys of Fe, Ni, and Cr covered with oxygen and for solid oxides of these elements, the emission yield of monoatomic ions, Fe+, Ni+, and Cr+, are linear functions of the atomic concentrationsCFe,CNi, andCCr. This empirical law suggest that the emission ofM+ions obeys a binary process, involving dynamic electronic exchanges between theMsputtered atoms and their neighbors during inelastic collisions. The determined formula for the interrelationship between theM+intensities and the atomic concentrations is applied to the quantitative analysis of oxide films developed at high temperature on a refractory alloy.
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