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Variation of secondary ion emission yield with atomic concentrations of Fe, Ni, and Cr ternary alloys and oxides: Application to the analysis of thin oxide films

 

作者: J. C. Pivin,   C. Roques‐Carmes,   G. Slodzian,  

 

期刊: Journal of Applied Physics  (AIP Available online 1980)
卷期: Volume 51, issue 8  

页码: 4158-4163

 

ISSN:0021-8979

 

年代: 1980

 

DOI:10.1063/1.328273

 

出版商: AIP

 

数据来源: AIP

 

摘要:

For binary and ternary alloys of Fe, Ni, and Cr covered with oxygen and for solid oxides of these elements, the emission yield of monoatomic ions, Fe+, Ni+, and Cr+, are linear functions of the atomic concentrationsCFe,CNi, andCCr. This empirical law suggest that the emission ofM+ions obeys a binary process, involving dynamic electronic exchanges between theMsputtered atoms and their neighbors during inelastic collisions. The determined formula for the interrelationship between theM+intensities and the atomic concentrations is applied to the quantitative analysis of oxide films developed at high temperature on a refractory alloy.

 

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