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Energy loss near‐edge structure for materials containing light elements by reflection electron energy loss spectroscopy

 

作者: Toshinori Hayashi,   Kiyoaki Araki,   Shuji Takatoh,   Toru Enokijima,   Tetsurou Yikegaki,   Toru Futami,   Yoshifumi Kurihara,   Jun’ichi Tsukajima,   Kiichi Takamoto,   Takashi Fujikawa,   Seiji Usami,  

 

期刊: Applied Physics Letters  （AIP Available online 1995）
卷期: Volume 66, issue 1  

页码: 25-27

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.114169

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A reflection electron energy loss spectroscopy system has been developed to investigate local surface atomic structures around light elements such as C, N, and O. Electrons scattered inelastically on a surface with a small scattering angle are energy analyzed. This system was used to measure energy loss near‐edge structures (ELNESs) for materials such as BN, graphite, and NiO. The comparison between ELNES and x‐ray absorption near edge structure suggests that the ELNES is useful for the atomic structure analyses of surfaces. ©1995 American Institute of Physics.

 

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