Compensating defects in heavily nitrogen-doped zinc selenide: A photoluminescence study
作者:
M. Moldovan,
S. D. Setzler,
T. H. Myers,
L. E. Halliburton,
N. C. Giles,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 13
页码: 1724-1726
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118681
出版商: AIP
数据来源: AIP
摘要:
Photoluminescence (PL) from a heavily nitrogen-doped ZnSe epilayer grown by molecular beam epitaxy was studied as a function of excitation wavelength, power density, and temperature. Also, the time decay of the PL emission was measured. Detailed analysis of the PL data indicates that the deep broad emission is composed of three distinct recombination processes, two are dominant at low power and a third can be detected at higher excitation power. These three bands are labeledNI,NII, andNIIIwith corresponding peak energies at 2.54, ∼2.58, and 2.65 eV. TheNIband is accompanied by phonon replicas of energy 69±3 meV. The behaviors of theNI,NII, andNIIIbands are consistent with intracenter recombination, donor–acceptor pair recombination, and electron–acceptor recombination, respectively. ©1997 American Institute of Physics.
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