A statistical modeling of charge redistribution a‐d converters for yield optimum design
作者:
Tetsuo Tateishi,
Kunihiro Asadas,
期刊:
Electronics and Communications in Japan (Part III: Fundamental Electronic Science)
(WILEY Available online 1991)
卷期:
Volume 74,
issue 3
页码: 46-56
ISSN:1042-0967
年代: 1991
DOI:10.1002/ecjc.4430740306
出版商: Wiley Subscription Services, Inc., A Wiley Company
数据来源: WILEY
摘要:
AbstractAn analytical method has been applied to a charge redistribution A‐D converter. In this method, the element values of each constituent element in a circuit are treated as statistical probability variables. Hence, the probability distribution of the circuit characteristics of design objectives is derived analytically from the probability distribution of the element values. If the circuit characteristics are described in terms of the circuit element values, the probability distribution of the circuit characteristics is derived from the sensitivity analysis of the analytical expression.In the case where the probability distribution of the circuit characteristics cannot be determined by the sensitivity analysis alone such as in the case of the error characteristics of binary weighted capacitor array, the characteristics are shown to be derivable as the probability distribution by combining the combinatory logic error analysis.By means of the Monte Carlo simulation, the accuracy of the derived circuit characteristics is verified. By means of the probability distribution formula of the derived circuit characteristics, a formulation is carried out for design of the A‐D converter including the yield. A guideline for design by the nonlinear optimization is presented for the A‐D converter including the yield equ
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