Precise force curve detection system with a cantilever controlled by magnetic force feedback
作者:
Shin-ichi Yamamoto,
Hirofumi Yamada,
Hiroshi Tokumoto,
期刊:
Review of Scientific Instruments
(AIP Available online 1997)
卷期:
Volume 68,
issue 11
页码: 4132-4136
ISSN:0034-6748
年代: 1997
DOI:10.1063/1.1148357
出版商: AIP
数据来源: AIP
摘要:
We present the development of an atomic force microscope (AFM) with an externally controllable force using an electromagnet. The position of the AFM cantilever with magnetic material at the end of the backside is controlled directly by the external magnetic field of an electromagnet. It is possible to use an optical detection system because the electromagnet is located inside the piezo tube on which the sample is mounted. A magnetic force feedback system has been implemented in this AFM. The effective stiffness of the cantilever is increased by the open loop gain of the feedback. We are able to control the motion of a soft cantilever (0.16 N/m) with this feedback system in air. Force feedback using an electromagnet allows the elimination of “snap-in” contact which may physically damage the tip and mica sample. ©1997 American Institute of Physics.
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