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X‐ray study of stacking faults in a double hexagonal close‐packed Au&sngbnd;Cd&sngbnd;In alloy

 

作者: Y. Babu Rao,   Shrikant Lele,   P. Rama Rao,  

 

期刊: Journal of Applied Physics  (AIP Available online 1973)
卷期: Volume 44, issue 7  

页码: 3028-3033

 

ISSN:0021-8979

 

年代: 1973

 

DOI:10.1063/1.1662701

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A study of the x‐ray powder pattern resulting from a cold‐worked hexagonal close‐packed Au&sngbnd;Cd&sngbnd;In alloy containing 17.5 at.% Cd and 5.0 at.% In has been made. Quantitative analysis of observed anomalous peak broadening, peak shifts, and peak asymmetry in the powder pattern shows evidence for only three of the nine faults, which have earlier been postulated for this structure, namely intrinsic‐ch, intrinsic‐h, and intrinsic‐2hwith respective fault probabilities of &agr;ch=0.045, &agr;h=0.036, and &agr;2h=0.002.

 

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