X‐ray study of stacking faults in a double hexagonal close‐packed Au&sngbnd;Cd&sngbnd;In alloy
作者:
Y. Babu Rao,
Shrikant Lele,
P. Rama Rao,
期刊:
Journal of Applied Physics
(AIP Available online 1973)
卷期:
Volume 44,
issue 7
页码: 3028-3033
ISSN:0021-8979
年代: 1973
DOI:10.1063/1.1662701
出版商: AIP
数据来源: AIP
摘要:
A study of the x‐ray powder pattern resulting from a cold‐worked hexagonal close‐packed Au&sngbnd;Cd&sngbnd;In alloy containing 17.5 at.% Cd and 5.0 at.% In has been made. Quantitative analysis of observed anomalous peak broadening, peak shifts, and peak asymmetry in the powder pattern shows evidence for only three of the nine faults, which have earlier been postulated for this structure, namely intrinsic‐ch, intrinsic‐h, and intrinsic‐2hwith respective fault probabilities of &agr;ch=0.045, &agr;h=0.036, and &agr;2h=0.002.
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