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Ion‐beam‐induced conductivity in polymer films

 

作者: T. Venkatesan,   S. R. Forrest,   M. L. Kaplan,   C. A. Murray,   P. H. Schmidt,   B. J. Wilkens,  

 

期刊: Journal of Applied Physics  (AIP Available online 1983)
卷期: Volume 54, issue 6  

页码: 3150-3153

 

ISSN:0021-8979

 

年代: 1983

 

DOI:10.1063/1.332471

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Polymer films darken upon irradiation with energetic ion beams. At high doses (1016–1017cm−2) of 2‐MeV Ar+ions, the resistivity of these insulating films decreases dramatically to 3.5×10−3&OHgr; cm. Furthermore, over a wide range of doses (1014–1015cm−2) these films exhibit a temperature‐dependent resistivity characteristic of carrier transport via hopping between isolated conducting islands. Rutherford backscattering measurements indicate that while a substantial amount of the carbon is retained in the film, other constituent elements are lost. Raman spectra show that the films are highly disordered at large ion doses.

 

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