Ion‐beam‐induced conductivity in polymer films
作者:
T. Venkatesan,
S. R. Forrest,
M. L. Kaplan,
C. A. Murray,
P. H. Schmidt,
B. J. Wilkens,
期刊:
Journal of Applied Physics
(AIP Available online 1983)
卷期:
Volume 54,
issue 6
页码: 3150-3153
ISSN:0021-8979
年代: 1983
DOI:10.1063/1.332471
出版商: AIP
数据来源: AIP
摘要:
Polymer films darken upon irradiation with energetic ion beams. At high doses (1016–1017cm−2) of 2‐MeV Ar+ions, the resistivity of these insulating films decreases dramatically to 3.5×10−3&OHgr; cm. Furthermore, over a wide range of doses (1014–1015cm−2) these films exhibit a temperature‐dependent resistivity characteristic of carrier transport via hopping between isolated conducting islands. Rutherford backscattering measurements indicate that while a substantial amount of the carbon is retained in the film, other constituent elements are lost. Raman spectra show that the films are highly disordered at large ion doses.
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