Efficient defect passivation by hot-wire hydrogenation
作者:
R. Plieninger,
H. N. Wanka,
J. Ku¨hnle,
J. H. Werner,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 15
页码: 2169-2171
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119371
出版商: AIP
数据来源: AIP
摘要:
Atomic hydrogen, produced at a hot wire, passivates bulk defects in polycrystalline silicon without damaging surface regions. Solar cells from such polycrystalline silicon respond much more favorably to hot-wire hydrogenation than to low-energy ion implantation or a direct-current plasma treatment. Hot-wire passivation yields a hydrogen concentration close to the surface of 8×1019cm−3and improves the minority carrier diffusion length of solar cells by up to 100&percent;. Implantation as well as conventional plasma treatment result in lower hydrogen concentration and, consequently, in much smaller improvements of diffusion lengths. ©1997 American Institute of Physics.
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