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Efficient defect passivation by hot-wire hydrogenation

 

作者: R. Plieninger,   H. N. Wanka,   J. Ku¨hnle,   J. H. Werner,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 15  

页码: 2169-2171

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119371

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Atomic hydrogen, produced at a hot wire, passivates bulk defects in polycrystalline silicon without damaging surface regions. Solar cells from such polycrystalline silicon respond much more favorably to hot-wire hydrogenation than to low-energy ion implantation or a direct-current plasma treatment. Hot-wire passivation yields a hydrogen concentration close to the surface of 8×1019cm−3and improves the minority carrier diffusion length of solar cells by up to 100&percent;. Implantation as well as conventional plasma treatment result in lower hydrogen concentration and, consequently, in much smaller improvements of diffusion lengths. ©1997 American Institute of Physics.

 

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